Nano-Safety 2nd Edition

Nano-Safety 2nd Edition by Dominick E. Fazarro, Christie M. Sayes, Walt Trybula, Jitendra S. Tate, and Craig Hanks is an essential, modern guide to keeping people and workplaces safe in the age of nanotechnology. This updated edition synthesizes the latest science, practical methods, and regulatory perspectives to help researchers, EHS professionals, occupational hygienists, and policy makers manage nanomaterial risks with confidence.

Discover clear, evidence-based strategies for exposure monitoring, risk assessment, engineering controls, and personal protective equipment tailored to nanomaterials. The authors translate complex toxicology and measurement techniques into actionable practices — from laboratory benchtops to industrial production lines — helping readers reduce uncertainty and improve compliance with regional and global safety frameworks.

What sets this edition apart is its emphasis on real-world application: updated case studies, contemporary measurement technologies, and harmonized approaches to regulation and communication. Whether you are operating in the United States, Europe, or Asia, you’ll find guidance that supports cross-border safety programs and helps organizations meet evolving standards and best practices.

Ideal for safety managers, academic instructors, graduate students, and regulatory professionals, this book blends rigorous science with pragmatic checklists and decision-making tools. Its accessible structure makes it perfect as a reference for developing workplace policies, designing monitoring plans, or preparing training materials.

For anyone responsible for occupational health, environmental stewardship, or regulatory compliance in nanotechnology, Nano-Safety 2nd Edition is a timely, authoritative resource. Strengthen your safety program and stay ahead of emerging risks — order your copy today to bring expert, practical nano-safety guidance into your workplace or classroom.

Note: eBooks do not include supplementary materials such as CDs, access codes, etc.