Advanced Materials Characterization 1st Edition

Capture the cutting edge of materials science with Advanced Materials Characterization, 1st Edition by Ch Sateesh Kumar, M. Muralidhar Singh, and Ram Krishna. This authoritative guide draws you into the core techniques that define modern materials analysis—essential reading for students, researchers, and industry professionals across India and around the world.

Inside, you’ll find clear, methodical explanations of key characterization methods—X-ray diffraction (XRD), electron microscopy (SEM/TEM), atomic force microscopy (AFM), spectroscopy (FTIR, Raman, UV-Vis), thermal analysis (DSC, TGA), and mechanical testing—linked to real-world problems in metals, ceramics, polymers, composites, and nanomaterials. Each chapter balances theory with practical interpretation of results, helping you move from raw data to confident conclusions.

Praised for its concise pedagogy and problem-oriented approach, this volume supports coursework, laboratory work, and research planning. Helpful visuals and comparative tables simplify complex concepts, while worked examples and troubleshooting tips sharpen laboratory confidence and analytical rigor. Whether you’re preparing for advanced coursework, designing experiments, or writing publications, this book equips you with the skills to select appropriate techniques, optimize measurements, and interpret outcomes reliably.

Perfectly suited to academic programs and R&D labs in India and worldwide, Advanced Materials Characterization is a practical companion that bridges classroom learning and laboratory practice. Add this essential resource to your library today and elevate your materials analysis capabilities. Order now to strengthen your research toolkit and stay ahead in the fast-evolving field of materials science.

Note: eBooks do not include supplementary materials such as CDs, access codes, etc.